X-Ray Diffraction: Structure, Principles and Applications

$179.00

Kaimin Shih, PhD (Editor)
Department of Civil Engineering, The University of Hong Kong, Hong Kong

Series: Materials Science and Technologies
BISAC: TEC021000

An important milestone in the history of science, the diffraction of X-rays, was observed by Max von Laue in 1912. In the last 100 years, X-ray diffraction (XRD) studies have revealed highly valuable information about many ordered atomic structures seen in a variety of common materials. The understanding of material structures opened the door to the reliable application of these materials and allowed scientific discussions about material properties and structural features to become possible. Besides playing this crucial role in history, XRD has now also successfully transformed itself into a method in the forefront of extending much of our knowledge boundaries.

Written by more than 30 X-ray diffraction experts from 9 countries/regions, this book consists of 11 chapters examining the development of the XRD technique and demonstrating various new opportunities for its application. Each chapter discusses timely and important subjects surrounding the XRD technique, including the past and future of the single-crystal XRD technique and new explorations with coordination polymers; the very successful implementation of Rietveld refinement analysis for alloys, intermetallics, cements, and ceramics; the application of XRD in nanoparticles structure study; the methodological developments in quantifying the state of residual stress in materials; and the state-of-the-art progress in combining XRD principles with electron crystallography for structure determination. (Imprint: Nova)

Add to Wishlist
ISBN: N/A Categories: , , Tags: , ,

Table of Contents

Table of Contents

Preface pp. i-ix

Chapter 1. Development and Application of X-Ray Diffraction Technique for Single Crystal
(Xiao-Ming Lin, Xu-Jia Hong and Yue-Peng Cai, School of Chemistry and Environment, South China Normal University, Guangzhou, People’s Republic of China)pp. 1-22

Chapter 2. Structure Characterization of Coordination Polymers by X-Ray Diffraction Data
(Filipe B. de Almeida, Maria C. R. Freitas, Charlane C. Corrêa, Luciano H. Chagas, Márcia C. de Souza, Weberton R. do Carmo and Renata Diniz, Departamento de Química, Universidade Federal de Juiz de Fora, Juiz de Fora, Minas Gerais, Brazil, and others)pp 23-44

Chapter 3. X-Ray Diffraction Analysis of Magnetic Shape Memory Alloys
(Albert Carrillo, Joan Josep Suñol and Maria Lluïsa Escoda, GRMT, Departament de Física, Universitat de Girona, Campus Montilivi s/n, Girona, Spain)pp.45-68

Chapter 4. Crystal Structures of New Rare Earth Intermetallic Compounds
(Wei He, Key Laboratory of Nonferrous Metal Materials and New Processing Technology, Ministry of Education, Guangxi University, Nanning, China, and others)pp.69-116

Chapter 5. Application of Quantitative X-Ray Diffraction in Geoenvironmental Problems: Overview and Case Studies
(Maria Chrysochoou, Department of Civil and Environmental Engineering, University of Connecticut, Storrs, CT, USA)pp.117-134

Chapter 6. Quantitative X-Ray Diffraction for Revealing the Thermal Incorporation Behavior of Lead
(Kaimin Shih and Xingwen Lu, Department of Civil Engineering, The University of Hong Kong, Hong Kong)pp.135-160

Chapter 7. X-Ray Analysis of Metal Oxide-Metal Core-Shell Nanoparticles
(Faruq Mohammad, Lissinda du Plessis and Tanvir Arfin, Unit for Drug Research and Development, North-West University, South Africa, and others)pp.161-182

Chapter 8. Characterization of Materials Obtained by an Innovative Integrated Synthesis Method Aimed to the Hydrogen Technology
(Marcelo R. Esquivel, Centro Atómico Bariloche – Comisión Nacional de Energía Atómica, Bariloche, Río Negro, Argentina, and others)
pp.183-206

Chapter 9. Depth Resolved Measurement of the 3D Residual Stress State in Surface Engineered Aluminium by Synchrotron Diffraction
(D.T. Asquith, D.J. Hughes, D.G. Hattingh, M.N. James, J.R. Yates and A. Yerokhin, Sheffield-Hallam University, UK, and others)pp.207-222

Chapter 10. In-situ Nanofocused X-Ray Diffraction Combined with Scanning Probe Microscopy
(T.W. Cornelius, F. Mastropietro1, O. Thomas and T. Schülli, Aix-Marseille Université, Faculté des Sciences et Techniques, Campus de Saint-Jérôme, Marseille Cedex, France, and others)pp.223-260

Chapter 11. Structure Solution Combining X-Ray and Electron Crystallography
(Jingliang Sun, College of Chemistry and Molecular Engineering,
Peking University, Beijing, China)pp.261-272

Index pp.273-282

Publish with Nova Science Publishers

We publish over 800 titles annually by leading researchers from around the world. Submit a Book Proposal Now!